Body bias compensation for aged transistors

ABSTRACT

Embodiments of the invention include on-chip transistor degradation detection and compensation. In one embodiment of the invention, an integrated circuit is provided including a circuit with a body bias terminal coupled to a body of one or more transistors to receive a body bias voltage; a programmable degradation monitor to detect aging of transistors, and a body bias voltage generator coupled to the circuit and the programmable degradation monitor. The body bias voltage generator to adjust the body bias voltage coupled into the circuit in response to transistor aging detected by the programmable degradation monitor. The programmable degradation monitor includes a reference ring oscillator, an aged ring oscillator, and a comparison circuit. The comparison circuit to compare data delays in the reference ring oscillator and the aged ring oscillator to detect transistor aging within the integrated circuit.

FIELD

Embodiments of the invention relate generally to on-chipcharacterization of transistor degradation and more specifically to thecompensation of transistor aging/degradation.

BACKGROUND

As p-channel and n-channel field effect transistors in complementarymetal oxide semiconductor integrated circuits have been scaled down,reliability problems with these transistors have increased.

In n-channel field effect transistors (NFETs) as the channel lengthshave decreased, transistor degradation, sometimes referred to as ahot-electron effect, has become a greater problem. The hot-electroneffect has been studied for quite some time now. Power supplies wereaccordingly reduced as the transistors were scaled down in order tominimize the hot-electron effect. Designers can design around thissomewhat by increasing the channel length of a transistor or increasesignal slew rates. For example, the channel lengths of certaintransistors that may experience greater stress, such as output drivers,may be increased over that of the minimum channel lengths, in order todecrease the hot electron effect.

In the p-channel field effect transistors (PFETs), a new transistordegradation has more recently been discovered. This phenomenon issometimes referred to as “negative bias temperature instability” (NBTI)but may more commonly be referred to as PMOS BT (p-channel metal oxidesemiconductor field effect transistor (“PMOS”) bias temperature) or PBTas it causes the turn on threshold (Vth) of the PFET to shift (anincrease in the absolute value) and degrades drain current when devicesare biased in inversion. Thus the strength of active PFETs in anintegrated circuit will degrade accumulatively over the product lifetime.

In order to ascertain whether integrated circuit designs andsemiconductor processes can withstand these transistor degradingeffects, integrated circuits are put through quality assurance andreliability testing.

Typical quality assurance and reliability testing for integratedcircuits “burn-in” or runs the functional device for extended periods oftime in hot ovens at higher voltages and then test or characterize thefunctionality of the integrated circuit over the corners of the powersupply, operating temperature, and clock speed to see if it stillfunctions. However, “burn-in” is not actually how an integrated circuitis used in a system. The integrated circuit experiences other conditionssuch as power cycling, large temperature variations, and even physicalvibration while in use.

In other cases, dedicated test integrated circuits are used to determinethe quality assurance and the reliability of a given semiconductorprocess. These dedicated test integrated circuits that providecharacterization information, have little to no functionality and aretypically designed for experimental testing only. In order to obtain ameasure of the quality assurance and the reliability, the dedicated testintegrated circuit may be similarly “burned-in” and then tested orcharacterized over the corners of the power supply and operatingtemperature. In this case measurements are taken to try and determinethe reliability and quality of a process and a design. But again, thisis not actually how an integrated circuit is used in a system.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a cross section of an integrated circuit including aP channel transistor and an N channel transistor.

FIG. 2A illustrates a schematic symbol an N channel transistor.

FIG. 2B illustrates a schematic symbol for a P channel transistor.

FIG. 3 illustrates a schematic diagram of an inverter coupled to a bodybias voltage generator.

FIGS. 4A-4C are waveform diagrams illustrating the improvement inthreshold voltage and saturation current for a reduction in body bias ofa P channel transistor over time.

FIG. 5A is a schematic symbol of an inverter with power, ground, and Pchannel transistor body bias connections.

FIG. 5B is a schematic symbol of a NAND gate with power, ground, and Pchannel transistor body bias connections.

FIG. 5C is a schematic symbol of a NOR gate with power, ground, and Pchannel transistor body bias connections.

FIG. 6A is a block diagram of a system including an integrated circuitwith a programmable degradation monitor and on-chip bias voltageregulator/generator.

FIG. 6B is a block diagram of a system including an integrated circuitwith a programmable degradation monitor coupled to an off-chip biasvoltage regulator/generator.

FIG. 7 is a functional block diagram of integrated on-chip functionalblocks to provide transistor degradation monitoring.

FIG. 8 is a functional block diagram of one embodiment of a programmabledegradation monitor for the integrated circuits illustrated in FIGS.6A-6B.

FIG. 9 is a transistor schematic diagram of an embodiment of a transfergate multiplexer.

FIG. 10 is a transistor schematic diagram of an embodiment of aselectively enabled programmable delay stage.

FIGS. 11A-11B are transistor schematic diagrams of embodiments of atri-state buffer.

FIG. 12 is a waveform diagram illustrating the functionality of theprogrammable degradation monitor in a new or fresh state.

FIG. 13 is a waveform diagram illustrating the functionality of theprogrammable degradation monitor in an aged state.

FIG. 14 is a block diagram of a typical computer system in whichembodiments of the invention may be utilized.

FIG. 15 is a block diagram of a central processing unit in whichembodiments of the invention may be utilized.

DETAILED DESCRIPTION

In the following detailed description of embodiments of the invention,numerous specific details are set forth in order to provide a thoroughunderstanding of the invention. However, it will be obvious to oneskilled in the art that the embodiments of the invention may bepracticed without these specific details. In other instances well knownmethods, procedures, components, and circuits have not been described indetail so as not to unnecessarily obscure aspects of the embodiments ofthe invention.

Note that references to p-channel transistor and n-channel transistorare used herein to refer to transistor switches that maybe formed out ofp-channel field effect transistors (PFET or PMOS) and n-channel fieldeffect transistors (NFET or NMOS) respectively. Also note that thechannel widths and lengths of the transistors may be modified asdesired.

There are two known significant transistor degradation mechanisms thataffect circuit performance. These significant transistor degradationmechanisms are PMOS BT transistor degradation and NMOS hot electrontransistor degradation. An integrated on-chip characterization ormonitoring circuit is used to quantify these two transistor degradationor aging effects. The on-chip characterization or monitoring circuit isintegrated onto the same monolithic die or substrate as the functionalblocks of the integrated circuit. In this manner, some circuits of theon-chip characterization or monitoring circuit experience the samestresses of the functional blocks within a system.

To separately quantify these two transistors aging effects, one or morepairs of ring oscillators or data paths may be used to monitor thetransistor degradation. One pair of ring oscillators may be designed toobtain the amount of PMOS BT transistor degradation. Another pair of thering oscillators may be designed to obtain the amount of NMOS hotelectron transistor degradation in conjunction with PMOS BT transistordegradation. Subtraction of one value from the other may be used toobtain the amount of NMOS hot electron transistor degradation. A singlepair of ring oscillators may be used to obtain the amount of NMOS hotelectron transistor degradation in conjunction with PMOS BT transistordegradation. In some cases, PMOS BT transistor degradation is thedominating transistor degradation mechanism so that NMOS hot electrontransistor degradation can be ignored or estimated.

The levels of PMOS BT and hot electron transistor degradation determinedby the on-chip characterization or monitoring circuit may be used toquantify maximum frequency (Fmax) clock degradation of an integratedcircuit and the risks of special circuits found therein. The levels ofPMOS BT and hot electron transistor degradation may also be used tocalibrate aging parameters and models in various aging simulators toprovide better correlation to the actual silicon when analyzing speedpath aging and design fixes thereto. By detecting PMOS BT and/or hotelectron transistor degradation on chip, compensation may be made byvarying a body bias voltage applied to transistors so that performancein aged circuitry is improved up to that of non-aged circuitry.

Embodiments of the invention include methods and apparatuses to monitoror characterize amounts of transistor degradation, accumulated duringthe lifetime of a semiconductor device. Pairs of ring oscillators withsubstantially similar transistor networks or circuits are provided. Oneof the ring oscillators of the pairs is enabled when the integratedcircuits are powered on so that it is under stress during the lifetimeof the integrated circuit. The other one of the ring oscillators of thepairs is only enabled when a measure of the transistor degradation istaken, and otherwise, is “specially biased” so that it is not understress during the lifetime of the integrated circuit.

These specially biased or selectively enabled ring oscillators provide areference ring oscillation output to compare with a degraded or agedring oscillation output. In these specially biased ring oscillators, thetransistors will not degrade or age as they are disabled and unbiasedduring a substantial portion of their lifetimes. Thus, these speciallybiased ring oscillators provide a “fresh” reference output for eachintegrated circuit to which they are integrated on-chip.

Embodiments of the invention enable characterization and compensation ofP-channel transistor degradation in an integrated circuit.

In one embodiment of the invention, the data delay between a stressedand an unstressed ring oscillator is compared to detect if transistorlevel device degradation has occurred. If so, compensation is providedby way of altering the body bias voltage applied to P-channeltransistors in circuitry. By adjusting the back side bias voltageapplied to a PMOS device, the body effect can increase the PMOS deviceperformance. The PMOS devices typically reside in N-wells over asubstrate on an integrated circuit. Forward biasing the N-well to 0.4Vbelow the source voltage of the PMOS device, the performance of circuitsin a typical combinatorial speed path may be improved by approximatelyfive percent. This percentage is greater than a frequency guard bandthat may be typically used in today's production tests for integratedcircuits. Compensating for p-channel transistor degradation enables anintegrated circuit to maintain its performance over a substantial partof its lifetime. Biasing the N-well to compensate for transistordegradation is particularly useful in speed critical circuit blocks.

In alternate embodiments of the invention the circuit power voltagelevel can be adjusted upward, increasing the voltage applied to thecircuits in order to compensate for an amount of degradation. Circuitpower voltage level may be adjusted upward by adjusting a voltageidentification (VID) code specifying the power supply voltage level orby adjusting upward the voltage provided by an on-chip voltageregulator.

In one embodiment of the invention, an integrated circuit is providedincluding a circuit with a body bias terminal coupled to a body of oneor more transistors to receive a body bias voltage; a programmabledegradation monitor to detect aging of transistors, and a body biasvoltage generator coupled to the circuit and the programmabledegradation monitor. The body bias voltage generator to adjust the bodybias voltage coupled into the circuit in response to transistor agingdetected by the programmable degradation monitor. The programmabledegradation monitor includes a reference ring oscillator, an aged ringoscillator, and a comparison circuit. The comparison circuit to comparedata delays in the reference ring oscillator and the aged ringoscillator to detect transistor aging within the integrated circuit.

In another embodiment of the invention, a method is provided thatincludes applying a data signal to a first ring oscillator and a secondring oscillator; comparing a first delay in the data signal in the firstring oscillator with a second delay in the data signal in the secondring oscillator to detect transistor degradation; and adjusting a bodybias to transistors in the integrated circuit to compensate fortransistor degradation in response to the comparing detecting transistordegradation. The method may further include enabling the first ringoscillator to age transistors therein prior to applying the data signal.

In yet another embodiment of the invention, a programmable degradationmonitor is provided including a reference ring oscillator, a degradablering oscillator, and a comparison circuit. The reference ring oscillatorprovides a reference frequency signal and a reference delay signal inresponse to a data input signal. The degradable ring oscillator providesan aged frequency signal and an aged delay signal in response to thedata input signal. The comparison circuit is coupled to the referencering oscillator and the degradable ring oscillator to compare thereference delay signal with the aged delay signal to detect transistoraging within an integrated circuit.

In still another embodiment, of the invention, a system is providedincluding an integrated circuit and a body bias voltage generatorcoupled to the integrated circuit. The integrated circuit includes afast circuit with one or more transistors having a body bias terminal toreceive a body bias voltage and a source terminal to receive a powersupply voltage, and a programmable degradation monitor to detectdegradation of transistors. The programmable degradation monitorincludes a reference ring oscillator, a degradable ring oscillator, anda comparison circuit. The comparison circuit compares data delay in thereference ring oscillator and the degradable ring oscillator to detecttransistor degradation within the integrated circuit. The body biasvoltage generator is coupled to the fast circuit and the programmabledegradation monitor of the integrated circuit. The body bias voltagegenerator adjusts either the body bias voltage or the power supplyvoltage coupled into the transistors of the fast circuit in response totransistor degradation detected by the programmable degradation monitor.

Referring now to FIG. 1, a monolithic integrated circuit chip 100 isillustrated as one embodiment of the invention. The integrated circuit100 includes on-chip characterization circuitry 102 and one or morefunctional circuits 104. The on-chip characterization circuitry 102includes transistor degradation monitors that may be used to calibrateaging parameters to correlate the actual silicon with simulation inorder to perform better speed path aging analysis and develop fixes thatare two. The integrated circuit 100 further includes on-chip body biascompensation circuitry 106 to compensate for the transistor aging. Asdiscussed further below, the integrated circuit 100 may further includeone or more functional blocks, such as an execution unit for example,and in which case the integrated circuit maybe a microprocessorintegrated circuit.

In FIG. 1, the p-channel transistor 100 resides in the N-well 101. TheN-well 101 resides in the p-minus (p−) substrate 103. The n-channeltransistor 102 also resides in the p-minus (p−) substrate 103. Each ofthe transistors 100 and 102 includes a source s, a gate g, and a draind.

The n-channel transistor 102 includes an n-channel body NB 112. Thep-channel transistor 100 includes an p-channel body PB 110. Then-channel body NB 112 includes a diffusion 113 coupled to the p-minus(p−) substrate 103. The diffusion 113 is a P plus diffusion to couple tothe p-minus (p−) substrate 103. The p-channel body PB 110 is coupled tothe diffusion 111 within the N-well 101. The diffusion 111 is an n-plus(n+) diffusion to couple to the N-well 101.

FIG. 2A illustrates the n channel transistor schematic symbol. Then-channel transistor includes a source S, a drain d, and a gate g, andan N-body NB 112.

FIG. 2B illustrates the p-channel transistors schematic symbol. Thep-channel transistor includes a source S, a drain D, and a gate G, andP-body PB 110.

The P-body and N-body connections to the p-channel and n-channeltransistors respectively may be used to alter the threshold voltages ofthe transistors and obtain higher drain saturation currents. That isusing the P-body and N-body connections, the performance of thep-channel and n-channel transistors maybe improved by altering the biasvoltage applied to the respective connections.

Referring now to FIG. 3, an inverter coupled to a body bias voltagegenerator 304 is illustrated. The gates of the p-channel transistor 100and the n-channel transistor 102 are coupled together to the inputterminal. The drains of the p-channel transistor 100 and n-channeltransistor 112 are coupled together to the input terminal.

The P-body terminal PB 110 of the p-channel transistor 100 is coupled tothe body bias voltage generator 304. The N-body terminal NB 112 iscoupled to the source terminal S of the n-channel transistor 102. TheN-body terminal and the source terminal of the n-channel transistor 102may couple to the negative power supply voltage (ground or VSS) or aselectively enabled ground or VSS. The source terminal of the p-channeltransistor 100 maybe coupled to the positive power supply voltage VCC ora selectively enabled VCC.

The body bias generator 304 generates a P-body bias voltage PBB that iscoupled to the P-body connection 110 of the p-channel transistor 100. Byselectively controlling the body bias voltage generator 304, the P-bodybias voltage PBB 110 can alter the performance of the p-channeltransistor 100. As discussed further below, it will be shown thataltering the P-body bias voltage can improve the performance of thep-channel transistor 100 in order to compensate for p-channel transistordegradation.

Referring now to FIGS. 4A-4C, waveform diagrams illustrate theimprovement in threshold voltage and saturation current when a reductionin the body bias applied to the p-channel transistor occurs over time.

In FIG. 4A, the Y axis represents the difference between the positivepower supply voltage VCC and the body bias voltage VPBB (VCC-VPBB). TheX axis indicates time. Over a period of 100 nano-seconds, the body biasvoltage is altered such that this difference is reduced by about fourhundred millivolts. That is, the waveform illustrated in FIG. 4A showsthe body bias voltage VPBB increasing relative to VCC. Typically, theP-body terminal 110 is coupled to the source terminal of the p-channeltransistor 100 and the positive power supply voltage VCC. Instead, thebody voltage is being altered to change the performance of the p-channeltransistor.

The waveforms illustrated in FIGS. 4B and 4C correspond in time withthat of the waveform of FIG. 4A.

In FIG. 4B, the Y axis indicates the threshold voltage VTP of thep-channel transistor 100 in volts. The threshold voltage VTP of thep-channel transistor 100 is being reduced from approximately negative240 millivolts to about negative 210 millivolts in response to anincrease in the body bias voltage shown in FIG. 4A. That is, itsmagnitude is being reduced. The reduction in the threshold voltage ofthe p-channel transistor 100 can improve its performance. This isbecause the drain current is a function of the threshold voltage of thep-channel transistor.

In FIG. 4C, the Y axis indicates the drain saturation current IDSAT ofthe p-channel transistor 100. The magnitude of the saturation currentincreases corresponding to the decrease in the threshold voltage of thep-channel transistor illustrated in the waveform of FIG. 4B. Themagnitude of the saturation current increases from approximately 3.8milliamperes to approximately 4.1 milliamperes. Thus, by altering thebody bias voltage, the performance of the p-channel transistor 100 canbe improved.

Referring now to FIGS. 5A-5C, various schematic diagram symbols areillustrated for logic gates. The logic gates illustrated in FIGS. 5A-5Cinclude power and ground connections (VCC and GND, respectively) as wellas the body bias voltage connection PB. The basic logic gatesillustrated in FIGS. 5A-5C may be used to generate more complicatedcircuitry within the functional blocks of an integrated circuit as isdescribed below.

FIG. 5A illustrates a schematic diagram symbol of an inverter 300corresponding to that of the inverter 300 in FIG. 3 illustrated usingtransistor symbols. However, FIG. 5A does not illustrate the body biasvoltage generator 304 coupled to the Inverter 300. The schematic symbolof the inverter 300 illustrated in FIG. 5A is used throughout thisdetailed description of the embodiments of the invention.

Other logic gates may be formed to include the body bias voltageterminal PB in order to provide the bias voltage to the bodies of theirrespective p-channel transistors. In FIG. 5B, a NAND gate is illustratedhaving the body of its p-channel transistors coupled to the p-channelterminal PB. In FIG. 5C, a NOR gate is illustrated having the body ofits p-channel transistors coupled to the p-channel terminal PB.

Referring now to FIG. 6A, a block diagram of an integrated circuit 600Ais illustrated. Integrated circuit 600A includes a programmabledegradation monitor 602, an on-chip bias voltage regulator/generator604A, slow circuits 606, and fast circuits 608. The fast circuits 606may have little timing margin in their data paths in comparison with aclock cycle. In contrast, the slow circuits 606 may have lots of timingmargin with data paths having little delay in comparison with a clockcycle. The programmable degradation monitor 602 and the fast circuits608 include p-channel body terminals PB coupled to the P-body biasterminal PBB 620 of the on-chip bias voltage regulator/generator 604A.Thus, some of the p-channel transistors of the fast circuits 608 andsome of the p-channel transistors of the programmable degradationmonitor receive the P-body bias voltage. The slow circuits 606 do notneed to have their degradation compensated and thus do not have ap-channel body bias terminal PB to couple to the P-body bias terminalPBB 620 of the on-chip bias voltage regulator/generator 604A. Thus,p-channel transistors of the slow circuits 606 do not receive the P-bodybias voltage.

The programmable degradation monitor 602 generates an aged detectionsignal 622 that is coupled into the on-chip bias voltageregulator/generator 604A. In response to the aged detection signal 622,the on chip bias voltage regulator/generator may alter the P-body biasvoltage on the P-body bias terminal PBB 620 in order to compensate fortransistor degradation and improve the performance of the fast circuits608 in one embodiment of the invention. In another embodiment of theinvention, the on chip bias voltage regulator/generator may alter theregulation of the positive power provided to the internal circuitrywhile maintaining the P-body bias voltage on the P-body bias terminalPBB 620 constant in order to compensate for transistor degradation.

Power or a positive power supply voltage is coupled into the VCCterminal of the integrated circuit 600A. Ground or a negative powersupply voltage is coupled into the VSS or GND terminal of the integratedcircuit 600A. The power supply provided by the power and ground iscoupled into the circuitry of the integrated circuits. The on-chip biasvoltage regulator/generator 604A couples to the power and groundprovided by a power supply (not shown) in order to generate and regulatethe P-body bias voltage on the P-body bias terminal PBB 620. In anotherembodiment of the invention, the on-chip bias voltageregulator/generator 604A also internally regulates the power provided tothe internal circuitry from the external power supply.

Referring now to FIG. 6B a block diagram of an integrated circuit 600Bcoupled to an off chip bias voltage regulator/generator 604B isillustrated.

The integrated circuit 600B differs from the integrated 600A illustratedin FIG. 6A in that the bias voltage regulator/generator is off chip andnot on chip. That is, the off chip bias voltage regulator/generator 604Bis included as a part of a system on a printed circuit board with theintegrated circuit 600B. Integrated circuit 600B may includes theprogrammable degradation monitor 602, slow circuits 606, and fastcircuits 608 which were previously described with reference to theintegrated circuit 600A.

In one embodiment of the invention, power and ground are coupled intothe integrated circuit 600B at its VCC and GND terminals respectivelyand provided to the circuitry therein. Power and ground are also coupledinto the off chip bias voltage regulator/generator 604B to generate theP-body bias voltage for the P-body bias terminal PBBB 620 that iscoupled to selected circuitry such as the p-channel transistors of thefast circuits 608. In another embodiment of the invention, power andground are coupled into the off chip bias voltage regulator/generator604B to generate the P-body bias voltage as well a regulated positivepower supply that is coupled into the VCC terminal of the integratedcircuit 600B.

Referring now to FIG. 7, a functional block diagram of on-chipcharacterization circuitry is illustrated. The on-chip characterizationcircuitry includes a selectively-enabled ring oscillator 702, afree-running ring oscillator 704, a comparison circuit 706, and acontrol circuit 708. Periodically, an integrated circuit may cause theon-chip characterization circuitry to measure transistor degradation.One or more degradation levels 716 may be generated by the comparisoncircuit 706.

The degradation levels 716 may be read out from the integrated circuitby a user system to adapt the user system to it in one embodiment of theinvention. In another embodiment of the invention, the degradationlevels 716 may be read out from the integrated circuit by a test orcharacterization system in order to obtain the degradation data and useit to better calibrate a model simulation of transistor degradation. Inyet another embodiment of the invention, the degradation levels 716 maybe used by the integrated circuit 100 internally in order to adapt tothe aging or transistor degradation of its own transistors.

The selectively-enabled ring oscillator 702 and free-running ringoscillator 704 form a pair of ring oscillators (ROs) that may be used asa transistor degradation monitor to characterize transistor degradation.One or more pairs of ring oscillators (selectively-enabled ringoscillator 702 and free-running ring oscillator 704) may be used tocharacterize various types of transistor degradation.

The selectively-enabled ring oscillator 702 generates the referencefrequency output F_(REF) 713 which is coupled into the comparisoncircuit 706. The transistors in the selectively-enabled ring oscillator702 are generally considered to be fresh. The free-running ringoscillator 704 generates a degraded frequency F_(DEG) 715 which iscoupled into the comparison circuit 706. The transistors in theselectively-enabled ring oscillator 702 are generally considered to beaged or degraded.

The free-running ring oscillator 704 and the selectively-enabled ringoscillator 702 have substantially similar circuits including transistorsand interconnections. However, the p-body terminal of the p-channeltransistors in the selectively-enabled ring oscillator 702 are coupledto VCC while the p-body terminal of some of the p-channel transistors inthe free-running ring oscillator 704 are coupled to the P-body biasvoltage PBB 620. This way, the effectiveness of the body biascompensation may be determined.

The free-running ring oscillator 704 and the selectively-enabled ringoscillator 702 may be positioned in the integrated circuit 100 in thesame location to obtain a measure of transistor degradation in onelocation. A duplicate pair may be positioned in another location of theintegrated circuit to obtain a measure of transistor degradation at adifferent location on the integrated circuit. Alternatively, anotherfree-running ring oscillator 704 may be positioned at the differentlocation and compared with the same selectively-enabled ring oscillator702 to obtain a measure of transistor degradation at a differentlocation.

As discussed previously, there are two significant transistordegradation mechanism that are known which affect circuit performance,PMOS BT transistor degradation and NMOS hot electron transistordegradation. Each transistor in the free-running ring oscillator 704 andthe selectively-enabled ring oscillator 702 with rectangular shapedchannels has a width and a length. Regardless of their size of width andlength, the PFETs may experience PMOS BT transistor degradation. NFETsexperience hot electron transistor degradation if they have shortchannels, where the length of their channels is relatively short.

In one embodiment on the invention, each transistor of the pair of thefree-running ring oscillator 704 and the selectively-enabled ringoscillator 702 may be designed with a relatively short channel, such asless than two microns, one micron to one-tenth of a micron for example.In this case, the NFETs of the free-running ring oscillator 704experience hot electron transistor degradation and the PFETs of thefree-running ring oscillator 704 experience PMOS BT transistordegradation. In this manner, the pair of the free-running ringoscillator 704 and the selectively-enabled ring oscillator 702 can beused to measure the combination of PMOS BT transistor degradation andhot electron transistor degradation.

To avoid hot electron transistor degradation in the NFETs of thefree-running ring oscillator 704, each NFET transistor of the pair ofthe free-running ring oscillator 704 and the selectively-enabled ringoscillator 702 pair can be designed with a relatively long channel, suchas greater than two microns for example. In this manner, the pair of thefree-running ring oscillator 704 and the selectively-enabled ringoscillator 702 can be used to measure PMOS BT transistor degradationalone without hot electron transistor degradation. The channel lengthsof the PFET transistors may be similar to that of the NFET transistorsand the widths of both PFET and NFET transistors may be alteredaccordingly to provide sufficient gain in each inverter to provide anoscillating output.

The free-running ring oscillator 704 operates continuously to generatean oscillating output when the integrated circuit 100 is powered on. Apower on control signal 714 generated by the control circuit 708 iscoupled into the enable input of the ring oscillator 704.

A characterization signal 712 is generated by the control circuit 708and coupled into the enable input of the selectively-enabled ringoscillator 702. The selectively-enabled ring oscillator 702 isselectively powered on by the characterization signal 712 when it isdesirable to measure transistor degradation. The selectively-enabledring oscillator 702 acts as a reference ring oscillator to generate areference ring oscillation signal F_(REF) 713 as it experiences nodegradation. The selectively enabled ring oscillator 702 includestransistors without transistor degradation in order to provide acomparison with the degraded transistors of the free-running ringoscillator 704.

Under control the control circuit 708, the comparison circuit 706compares the reference frequency 713 with the degraded frequency 715 inorder to determine a measure of degradation level 716. As thetransistors within the free-running ring oscillator 704 degrade, it isexpected that the degraded frequency output signal 715 will have a lowerfrequency in that of the reference frequency signal 713. Known methodsof measuring the frequency of a ring oscillator may be used in thecomparison circuit 706, such as that exemplified in U.S. Pat. No.6,535,013 by Samie B. Samaan, filed Dec. 28, 2000. However, a differentcomparison circuit may also be used herein in order to provide adetermination of transistor degradation and then compensate for suchdegradation.

Referring now to FIG. 8, a block diagram of the programmable degradationmonitor 602 is illustrated. The programmable degradation monitor 602includes a reference ring oscillator 802, a degradation ring oscillator804, a comparison circuit 806, and a controller 808 coupled together asshown to generate the aged detection signal 622. The programmabledegradation monitor 602 may further include additional comparisoncircuitry to monitor the reference frequency and/or the aged frequencysuch as a multiplexer 814 and inverter 816 coupled together as shown inFIG. 8.

The reference ring oscillator 802 includes a transfer gate multiplexer810R and a selectively enabled programmable delay stage 812R coupledtogether as shown. The degradation ring oscillator 804 includes thetransfer gate multiplexer 810A coupled together with the selectivelyenabled programmable delay stage 812A as shown. The comparison circuit806 includes a comparator consisting of a tri-state buffer 820 coupledtogether with a latch formed out of a NAND gate 824 and inverters 822and 826 as shown in FIG. 8.

Each programmable delay stage 812R and 812A includes an odd number ofinverters between their ring oscillator inputs (ROIN) and ringoscillator outputs (ROOUT) to set up a ring oscillator through themultiplexers 810A and 810R when the input is appropriately selected.Between the input ROIN and the output ROOUT in each programmable delaystage, there is an even number of inverters. In a ring oscillating mode,the output ROUT is coupled into the input ROIN of the programmable delaystage through the multiplexer. In an aged detection mode, the data inputDATAIN 611 is coupled into the ROIN input of the programmable delaystage. Each of the programmable delay stages further includes a powerterminal input VCC, a stress enable input STRSEN, a P-body inputterminal PB, faster timing control inputs FSTR[1:0], and slower timingcontrol inputs SLWR[1:0].

In the reference ring oscillator 802, the detect/test signal 610 iscoupled into the stress enable pin of the programmable delay stage 812R.The multiplexer output MOUT 811 is coupled into the ring oscillatorinput of the programmable delay stage 812R. The P-body terminal PB iscoupled to the positive power supply VCC as is the positive power supplyterminal VCC. The faster and slower input terminals are coupled toground. Thus, the timing of the programmable delay stage 812R is notaltered by the faster or slower control signals. The ring oscillatoroutput of the programmable delay stage 812R is coupled to the secondinput of the multiplexer 810R. The ring oscillator output is alsocoupled into the second input of the multiplexer 814 as the referencefrequency output REFFOUT 813. The even ring oscillator output ROOUTN iscoupled into a data input the tri-state buffer 820 as the REFFOUTNsignal 815.

The multiplexers 810A,810R include a first multiplexer input MIN0 and asecond multiplexer input MIN1 that are selectively coupled to themultiplexer output MOUT by the select control signal SEL. If the selectcontrol signal is a logical zero, the first multiplexer input MIN0 iscoupled to the multiplexer output MOUT. If the select control signal SELis a logical one, the second multiplexer input MIN1 is coupled to themultiplexer output MOUT. The first multiplexer input of each multiplexeris coupled to the data input DATAIN 611. The second multiplexer input ofeach multiplexer is respectively coupled to the ring oscillator outputROOUT of each programmable delay stage. The select input control signalsSEL of the multiplexers 810R,814 are coupled to the reference frequencyenable signal ENREFFREQ 612A. The select input signal SEL of themultiplexer 810A is coupled to the enable stress frequency input signal612B. Accordingly, if the enable reference frequency signal 612A is alogical one, the reference ring oscillator 802 generates the referencefrequency output on REFFOUT which is selectively coupled through themultiplexer 814, inverted and driven out by inverter 816 onto thefrequency output FOUT 817. If the enable reference frequency controlsignal 612A is a logical zero and the enable stress frequency controlsignal 612B is a logical one, the degradable ring oscillator 804generates the aged frequency output on AGEDFOUT which is selectivelycoupled through the multiplexer 814, inverted and driven out by inverter816 onto the frequency output FOUT 817.

In the degradable ring oscillator 804, the P-body terminal PB ofprogrammable delay stage 812A is coupled to the P-body bias voltage 620to compensate for aging of the p-channel transistors. The multiplexeroutput MOUT 831 is coupled into the ring oscillator input ROIN of theprogrammable delay stage 812A. The stress enable pin is coupled to thepositive power supply VCC as is the positive power supply terminal VCC.The ring oscillator output of the programmable delay stage 812A iscoupled to the second input MIN1 of the multiplexer 810A. The ringoscillator output ROOUT is also coupled into the first input MIN0 of themultiplexer 814 and the enable prime ENP of the tri-state buffer 820 asthe aged frequency output AGEDFOUT 833. The even ring oscillator outputROOUTN is coupled into enable input EN of the tri-state buffer 820 asthe AGEDFOUTN signal 835.

At multiplexer 810A, the enable stress frequency control signal 612Bselects between the DATAIN and the AGEDFOUT signal 833 to be input intothe programmable delay stage 812A. Either signal may be used to age andstress the degradable ring oscillator 804. If the enable stressfrequency control signal 612B is a logical one, the degradable ringoscillator 804 functions in a ring oscillating mode to stress and agethe transistors therein. Alternatively if the enable stress frequencycontrol signal 612B is a logical one, a data toggling mode/age detectionmode, a signal on the data input DATAIN 611 may be used to stress andage the transistors in the degradable ring oscillator 804. The datainput DATAIN may be a stress pattern of ones and zeroes causing theinverters to continuously change from one logic state to another. Forexample, the data input DATAIN may couple to a clock terminal and thestress pattern may be a clock signal. As another example, the data inputDATAIN may couple to a logic node internally within an integratedcircuit and the stress pattern may be an actual data pattern. In thismanner, the degradable ring oscillator 804 may experience the sameswitching frequency at an actual node of a functional circuit andreceive substantially similar AC stress.

The faster and slower input terminals of the programmable delay stage812A are respectively coupled to the faster control signals FASTER [1:0]807 and the slower control signals SLOWER[1:0] 809. Thus, the timing ofthe programmable delay stage 812A may be altered by the faster or slowercontrol signals. This may be desirable during the initial factorytesting when circuits are new and fresh to compensate for processvariations that cause a difference in the initial delays between thereference ring oscillator 802 and the degradable ring oscillator 804.That is when the circuitry is fresh, the faster or slower controlsignals may be used to vary the delay provided by the inverters in thedelay stage 812A and zero out input skew into the comparison circuitry806 so that the aged signal 622 will stay at logical zero, indicating afresh circuit. The faster control signals allow the delay provided bythe inverters in the delay stage 812A to be reduced so that the agedsignal 622 does not always stay a logical one value, constantlyindicating an aged circuit.

The controller 808 can generate the control signals to control the ringoscillators 802,804, the comparison circuitry 806, and select theoscillating frequency (REFFOUT or AGEDFOUT) that is output from theprogrammable degradation monitor 602. The controller 808 generates thedata input signal 611, the faster control signals 807, the slowercontrol signals 809, the detect/test signal 610, the enable stressfrequency signal 612B, and the enable reference frequency signal 612A.The controller 808 maybe a part of the programmable degradation monitor602 or a part of the integrated circuit external thereto.

If no testing or age detection is to be performed, the detect/testsignal 610 is a logical zero causing the NAND gate 824 and inverter 622to drive the aged output signal 622 to a logical zero. The input ofinverter 822 is coupled to the output of the NAND gate 824 such thatwhen node 823 is a logical high, node 821 is driven to a logical zero toinitialize the comparison circuitry. When age detection is to beperformed, the detect/test signal 610 is a logical one enabling the NANDgate 824 and inverter 622 to capture and latch a change in state on node821 from a logical zero to a logical one indicating that the degradablering oscillator 804 has aged over that of the reference ring oscillator802. In order to do so, the tri-state driver 820 is stronger tooverdrive the weaker inverter 822 and change the state of node 821.

In order to perform age detection, the detect/test signal 610 is set toa logical one, the enable reference frequency ENREFFREQ 612A is set to alogical zero, the enable stress frequency ENSTRSFREQ 612B is set to alogical zero, and a data signal is provided on the data input DATAIN611. The data signal propagates equally through the multiplexers810A,810R and into the ring oscillator inputs ROIN of each of theprogrammable delay stages 812A,812R respectively. If the programmabledelay stage 812A has not aged, the delay of the data signal to the ringoscillator output ROOUT should be similar to the delay in theprogrammable delay stage 812R. If the programmable delay stage 812A ofthe degradable ring oscillator has aged, the delay of the data signal tothe ring oscillator output ROOUT should be greater than the delay in theprogrammable delay stage 812R of the reference ring oscillator. That iswhen aged, the data input signal will reach the aged output signalsAGEDFOUT 835 and AGEDFOUTN 833 generated by the degradable ringoscillator 804 at a later time than the reference output signal REFFOUTN815 generated by the reference ring oscillator 802.

The aged output signals AGEDFOUT 835 and AGEDFOUTN 833 generated by thedegradable ring oscillator 804 enable and disable the tri-state driver820. Coincidentally, the reference output signal REFFOUTN 815 generatedby the reference ring oscillator 802 races against the AGEDFOUT 835 andAGEDFOUTN 833 signals to try and drive out a data signal through thetri-state driver 820.

If there is no aging in the degradable ring oscillator, the data inputsignal DATAIN should reach the aged output signals AGEDFOUT 835 andAGEDFOUTN 833 and the reference output signal REFFOUTN 815 at nearly thesame time. Thus with no aging, the tri-state driver 820 may be disabledby the output signals AGEDFOUT 835 and AGEDFOUTN 833 before thereference output signal REFFOUTN 815 can change the output state of thetri-state driver.

On the other hand with some aging in the degradable ring oscillator, thedata input signal DATAIN may change the state of the reference outputsignal REFFOUTN 815 before reaching the aged output signals AGEDFOUT 835and AGEDFOUTN 833. This difference in delay from the aged circuitry cancause a change in the logical state of node 821 while the tri-statedriver 820 is enabled, before the aged output signals AGEDFOUT 835 andAGEDFOUTN 833 can disable the tri-state driver 820. With node 821 beingdriven from a logical zero to a logical one, the aged signal 622 isdriven to a logical one to indicate that aged circuitry has beendetected.

As discussed previously, the aged signal 622 is coupled into the bodybias voltage generator to compensate for the transistor degradation thatis detected. This P-body bias compensation is fed back and coupled intothe degradable oscillator 804 into the programmable delay stage 812A. Inthis case, another test for age detection can be made in order todetermine if the P-body bias compensation provided by the body biasvoltage generator/regulator is sufficient to overcome the transistordegradation or if further compensation is needed. If the delay throughring oscillators 802,804 is similar with the change in the body biascompensation, indicating that the compensation is sufficient, the agedsignal 622 should remain low. If the delay through ring oscillators802,804 is different with the change in the body bias compensation,indicating that the compensation is insufficient, the aged signal 622should change state and once again indicate aged circuitry. In thiscase, the body bias voltage generator can further alter the P-body biascompensation in incremental steps until reaching a sufficient amount tocompensate for the aging or a maximum amount of compensation. In eithercase, the compensation can improve the overall performance of the fastcircuitry.

Referring now to FIG. 9, a transistor schematic diagram of a transfergate multiplexer 810 is illustrated. The multiplexer 810 includes a pairof CMOS fully complimentary transfer gates. One CMOS fully complimentarytransfer gate is formed by the n-channel transistor 902 and thep-channel transistor 901 coupled in parallel together. The other CMOSfully complimentary transfer gate is formed by the p-channel transistor903 and the n-channel transistor 904 coupled in parallel together. Thebody terminals of the p-channel transistors are traditionally coupled tothe source terminal. The transfer gate multiplexer can provide a moreequal delay between inputs and the output for the rise and fall of thedata input signal DATAIN. Otherwise, logic gates may be used to form themultiplexers 810A,810R.

The multiplexer 810 has a first data input MIN0 911 and a second datainput MIN1 915. The multiplexer 810 further has a select control input912 and a multiplexer output MOUT 915. The first data input 911 iscoupled into the source or drain of the transistors 901 and 902 whilethe multiplexer output 915 is coupled to the drain or source of thetransistors 901 and 902. The second data input 913 is coupled to thesource or drain of the p-channel transistor 903 and the n-channeltransistor 904 while the multiplexer output 915 is coupled to the drainor source of the p-channel transistor 903 and the n-channel transistor904.

The select control input 912 is coupled to the gates of the n-channeltransistor 904 and the p-channel transistor 901. The select controlinput 912 is also coupled into the input of inverter 906. The inverter906 inverts the select control signal at it's output 907 which is thencoupled into the gates of the n-channel transistor 902 and the p-channeltransistor 903. When the select

When the select control signal 912 is a logical zero, the p-channeltransistor 901 and the n-channel transistor 902 are turned on such thatthe first data input 911 is coupled to the multiplexer output 915. Whenthe select control signal 912 is a logical one, the n-channel transistor904 and the p-channel transistor 903 are turned on such that the seconddata input 913 is coupled to the multiplexer data output 915. In thismanner, the select control signal can selectively couple either thefirst data input or the second data input to the multiplexer dataoutput.

As illustrated in FIG. 9, the multiplexer output 915 is coupled to thering oscillator input ROIN of the respective programmable delay stage.The first data input 911 is coupled to the data input signal 611. Thesecond data input 913 is coupled to the ring oscillator output ROUT fromthe respective programmable delay stage. The select control terminal iscoupled to either the enable reference frequency signal 612A or theenable stress frequency signal 612B.

Referring now to FIG. 10, a selectively enabled programmable delay stage812 is illustrated. The programmable delay stage 812 illustrated in FIG.10, maybe used as the programmable delay stages 812R, 812A illustratedin FIG. 8.

The programmable delay stage 812 includes inverters 300A-300N, p-channeltransistor 1000, n-channel transistor 1002, inverters 1003A-1003B,n-channel transistors 1005A-1005D, and n-channel transistors 1006A-1006Dcoupled together as shown. As illustrated in FIG. 3 and FIG. 5A, theinverters 300A-300N include the P-body terminal PB coupled to the P-bodybias terminal PBB 1020. The stress enable signal STRSEN 1010 is coupledto the gates of the p-channel transistor 1000 and the n-channeltransistor 1002.

The ring oscillator input ROIN 1015 is coupled into the input of thefirst inverter 300A. Inverters 300A-300N are coupled in series togetherin a daisy chain. The ring oscillator output ROUT 1022 experiences anodd number of inversions from the ring oscillator input ROIN 1015. Theeven ring oscillator output ROOUTN 1024 experiences an even number ofinversions from the ring oscillator input ROIN 1015. Note that more orless p-channel and n-channel transistors may be paired together and usedto form N inverters, where N is an odd number.

Inverters 300A-300N are coupled to a ground enable node GNDEN 1001.Logically, the ground enable node GNDEN 1001 enables and disables thenegative power supply or ground from being coupled to the inverter chain330A-330N. When the programmable delay stage is enabled, an AC waveformmay be generated at ROOUT 304 when in a ring oscillating mode.Alternatively a delayed inverted waveform may be generated at ROOUT 304from that at the ring oscillator input ROIN when enabled in an ageddetection mode. When the programmable delay stage is disabled, theoutput ROOUT and ROOUTN may float to VDD while node 1001 is tied to VDD.

The p-channel transistor 1000 and the n-channel transistor 1002selectively enable the programmable delay stage 812. The n-channeltransistor 1002 selectively gates the negative power supply or ground tothe ground enable node GNDEN 1001 thereby enabling the programmabledelay stage in response to the stress enable signal 1010 being a logicalone. The p-channel transistor 1000 selectively gates the positive powersupply VCC to the ground enable node 1001 in response to the stressenable signal 10010 being a logical zero thereby disabling theprogrammable delay stage.

As illustrated in FIG. 8, the stress enable input to the programmabledelay stage 812A is coupled to the positive power supply VCC such thatthe programmable delay stage is always enabled and aged when power isprovided.

To program the timing of the programmable delay stage 812, the fastercontrol signals 807A-807B and the slower control signals 809A-809B areprovided. The faster and slower control signals determine whether thecapacitive loading at the gates of the transistors 1006A-1006D arerespectively coupled to the nodes between the inverters.

The faster control signals 807A-807B are respectively coupled into theinputs of the inverters 1003A-1003. The outputs of the inverters1003A-1003B are respectively coupled to the gates of the n-channeltransistors 1005A-1005B. The n-channel transistors 1005A-1005B areturned off in response to the faster control signals being a logicalone, such that the capacitive loading is not applied to the nodesbetween the inverters. This can speed up the delay path in theprogrammable delay stage 812 between ROIN 1015 and ROOUT 1022,ROOUTN1024.

The slower control signals 809A-809B are respectively coupled to thegates of the n-channel transistors 1005C-1005D. The n-channeltransistors 1005C-1005D are turned on in response to the slower controlsignals being a logical one such that the capacitive loading of thegates of the n-channel transistors 1006C-1006D is applied to therespective nodes between the inverters. This can slow down the delaypath in the programmable delay stage 812 between ROIN 1015 and ROOUT1022,ROOUTN 1024.

As illustrated in FIG. 8, the faster and slower control signals arecoupled to ground such that they are not used to control the timing ofthe delay path in the programmable delay stage 812R.

Referring now to FIG. 11A, a transistor schematic diagram of a tri-statebuffer 820A is illustrated. The tri-state buffer 820A includes p-channeltransistors 1100-1101 and n-channel transistors 1110-1111 coupledtogether as shown. The AGEDFOUT control signal 833 is coupled to thegate of the p-channel transistor 1100. The AGEDFOUTN control signal 835is coupled to the gate of the n-channel transistor 1111. The gates ofthe p-channel transistor 1101 and the n-channel transistor 1110 arecoupled to the REFFOUTN signal 815.

When the AGEDFOUT control signal 833 is a logical zero and the AGEDFOUTNcontrol signal 835 is a logical one, the tri-state buffer 820A isenabled. Conversely when the AGEDFOUT control signal 833 is a logicalone and the AGEDFOUTN control signal 835 is a logical zero, thetri-state buffer 820 is disabled. Receiving data on the REFOUTN 815, thetri-state buffer 820A drives inverted data onto the tri-state outputnode TRISTATOUT 821.

Referring now to FIG. 11B, a transistor schematic diagram of a tri-statebuffer 820B is illustrated. The tri-state buffer 820B alters inputsignal coupling to the transistors in comparison with the tri-statebuffer 802A. The tri-state buffer 820A includes p-channel transistors1100′-1101′ and n-channel transistors 1110′-1111′ coupled together asshown. The AGEDFOUT control signal 833 is coupled to the gate of thep-channel transistor 1101′. The AGEDFOUTN control signal 835 is coupledto the gate of the n-channel transistor 1110′. The gates of thep-channel transistor 1100′ and the n-channel transistor 1111′ arecoupled to the REFFOUTN signal 815. Otherwise, the tri-state buffer 820Bis similarly drives data out and is similarly enable and disabled incomparison with the tri-state buffer 820A.

As discussed previously, the AGEDFOUTN control signal 835 and theAGEDFOUT control signal 833 race the REFFOUTN signal 815 to disable thetri-state buffer before it changes state to perform a comparison betweenthe delay paths in the ring oscillators and detect aged transistors.

Referring now to FIG. 12, waveform diagram illustrates the functionalityof the programmable degradation monitor 812 when in a fresh or newstate. Waveforms 1210, 1211, 1215, 1222, 1233, and 1235 respectivelyrepresent signals on the detect/test control input 610, the data inputDATAIN 611, the aged detection output AGED 622, the even referencefrequency output REFFOUTN 815, the aged frequency output AGEDFOUT 833,and the even aged frequency output AGEDFOUTN 835. As the degradationring oscillator 804 is fresh or new, it is expected that no aging willbe detected such that the aged detection signal AGED 622 will remain ata logic zero level as is illustrated by waveform 1222.

As discussed previously, the AGED output signal 622 is reset orinitialized to a logical zero by means of the detect signal 610. Thedetect/test signal 610 transitions to a logical one in order to enableage detection as illustrated in waveform 1210. A square wave is providedby the controller 808 on the data input DATAIN as illustrated bywaveform 1211. The enable reference frequency control signal and theenable stress frequency control signal are set to logic zero levels bythe controller so that the data input waveform 1211 can propagatethrough each ring oscillator 802,804 to the respective outputs REFFOUTN815, and AGEDFOUT 835, AGEDFOUTN 833 and to the tri-state driver 820.

As there is no aging, the waveforms of the respective outputs REFFOUTN815, and AGEDFOUT 835, AGEDFOUTN 833 reach the tri-state driver 820 atsubstantially the same time as illustrated by waveform 1215 andwaveforms 1233,1235 respectively. Thus, the tri-state driver 820 isdisabled by the waveforms 1233,1235 before the waveform 815 can changeits output state and change the state of the aged detect output signalAGED 622 as illustrated by waveform 1222.

After a period of time, the circuitry of the integrated circuits age andcan reduce the overall performance there of. In which case, is desirableto detect the aging and compensate to recover the lost performance ofthe integrated circuitry.

Referring now to FIG. 13, waveform diagrams illustrate the functionalityof the programmable degradation monitor when in an aged state. Waveforms1210, 1211, 1215, 1322, 1333, and 1335 respectively represent signals onthe detect/test control input 610, the data input DATAIN 611, the ageddetection output AGED 622, the even reference frequency output REFFOUTN815, the aged frequency output AGEDFOUT 833, and the even aged frequencyoutput AGEDFOUTN 835. There is no change in waveforms 1210, 1211, and1215 from that shown in FIG. 12. However, as the degradation ringoscillator 804 is now aged, it is expected that aging will be detectedand that the aged detection signal AGED 622 will change state asillustrated by waveform 1322.

The AGED output signal 622 is reset or initialized to a logical zero bymeans of the detect signal 610. The detect/test signal 610 transitionsto a logical one in order to enable age detection as illustrated inwaveform 1210. A square wave is provided by the controller 808 on thedata input DATAIN as illustrated by waveform 1211. The enable referencefrequency control signal and the enable stress frequency control signalare set to logic zero levels by the controller so that the data inputwaveform 1211 can propagate through each ring oscillator 802,804 to therespective outputs REFFOUTN 815, and AGEDFOUT 835, AGEDFOUTN 833 and tothe tri-state driver 820.

Instead of reaching the tri-state driver at the same time, the waveforms1335, 1333 of AGEDFOUT 835, AGEDFOUTN 833 lag behind the waveform 1215of REFFOUTN 815. The waveform 1215 on REFFOUTN 815 reaches the tri-statedriver 820 before the waveforms 1335,1333 can disable the tri-statedriver. Thus, the waveform 1215 on REFFOUTN 815 changes the state of theaged detection signal AGED 622 as is illustrated by waveform 1322. Asdiscussed previously, the aged detection signal AGED is coupled into thebody bias generator in order to incrementally compensate for the agingand the lost performance.

Referring now to FIG. 14, a block diagram of a typical computer 1400 inwhich the embodiments of the invention may be utilized is illustrated.The computer 1400 includes a central processing unit (CPU) 1401,input/output devices (I/O) 1402 such as keyboard, modem, printer,external storage devices and the like and monitoring devices (M) 1403such as a CRT or graphics display. The monitoring devices (M) 1403provide computer information in a human intelligible format such asvisual or audio formats.

Referring now to FIG. 15, a block diagram of a typical centralprocessing unit 1401 in which the embodiments of the invention may beutilized is illustrated. The central processing unit 1401 includes amicroprocessor 1501 including the embodiments of the invention, a diskstorage device 1503, and a memory 1504 for storing program instructionscoupled together. Disk storage device 1503 may be a floppy disk, zipdisk, DVD disk, hard disk, rewritable optical disk, flash memory orother non-volatile storage device. The microprocessor 1501 and the diskstorage device 1503 can both read and write information into memory 1504over the memory bus 1504. Memory 1504 is typically dynamic random accessmemory (DRAM) but may be other types of rewritable storage.

The microprocessor 1501 is the integrated circuit 600A in one embodimentof the invention as illustrated in FIG. 6A including the on-chipprogrammable degradation monitor 602 and the bias voltagegenerator/regulator 604A. In another embodiment of the invention, themicroprocessor 1501 is the integrated circuit 600B as illustrated inFIG. 6A, including the on-chip programmable degradation monitor 602,coupled to an off-chip bias voltage generator/regulator 604B. In eithercase, the one or more of the fast circuits 608 and/or slow circuits 606may be part of an execution unit to execute one or more instructions ofthe microprocessor. The one or more instructions may be from a softwareprogram for example.

The embodiments of the invention can provide an integrated on-chipmonitoring of transistor degradation with compensation to maintain theperformance of circuits in integrated circuit chips.

While inverters coupled in series together in a daisy chain have beendisclosed to provide an odd number of inversions of the ring oscillator,it is understood that any other inverting logic gate may be used, suchas NOR gates and/or NAND gates with a switched power supply terminal. Aninverting logic gate is a logic gate that receives a logical inputsignal and inverts it when generating a logical output signal. That is,inverters 300A-300N may be a combination of inverters, NAND gates, andNOR gates with the respective transistors being added to provide suchgating. Additionally, the inverting logic gates may be coupled togetherinto a series circuit and non-inverting logic gates may be interleavedbetween pairs of inverting logic gates. A non-inverting logic gate is alogic gate that receives a logical input signal and does not invert itwhen generating a logical output signal. Examples of non-inverting logicgates include a pass gate or transfer gate, an AND gate, an OR gate, anda buffer. With interleaved non-inverting logic gates included in theseries circuit of inverting logic gates, the series circuit can be usedto more closely resemble a data path.

While certain exemplary embodiments of the invention have been describedand shown in the accompanying drawings, it is to be understood that suchembodiments of the invention are merely illustrative of and notrestrictive on the broad invention, and that this invention not belimited to the specific constructions and arrangements shown anddescribed, since various other modifications may occur to thoseordinarily skilled in the art.

1. An integrated circuit comprising: a circuit including a body biasterminal coupled to a body of one or more transistors to receive a bodybias voltage; a programmable degradation monitor to detect aging oftransistors, the programmable degradation monitor including a referencering oscillator, an aged ring oscillator, and a comparison circuit, thecomparison circuit to compare data delay in the reference ringoscillator and the aged ring oscillator to detect transistor agingwithin the integrated circuit; and a body bias voltage generator coupledto the circuit and the programmable degradation monitor, the body biasvoltage generator to adjust the body bias voltage coupled into thecircuit in response to transistor aging detected by the programmabledegradation monitor.
 2. The integrated circuit of claim 1, wherein thebody bias voltage generator incrementally adjusts the body bias voltagein response to the programmable degradation monitor detecting transistoraging.
 3. The integrated circuit of claim 2, wherein for eachincremental adjustment in the comparison circuit, the programmabledegradation monitor to evaluate if transistor aging has been alleviatedor if transistor aging has been detected once again.
 4. The integratedcircuit of claim 2, wherein the comparison circuit determines that thedata delay in the aged ring oscillator is greater than the data delay inthe reference ring oscillator to detect transistor aging.
 5. Theintegrated circuit of claim 1, wherein the circuit is a speed criticalcircuit compensated for transistor aging to maintain the overallperformance of the integrated circuit.
 6. The integrated circuit ofclaim 5, wherein the one or more transistors in the circuit arep-channel field effect transistors.
 7. The integrated circuit of claim1, wherein the aged ring oscillator has aged transistors; and thereference ring oscillator is without aged transistors.
 8. The integratedcircuit of claim 1, wherein the aged ring oscillator and the referencering oscillator are substantially similar circuits.
 9. The integratedcircuit of claim 1, wherein the PDM further includes a control circuitcoupled to the reference ring oscillator, the aged ring oscillator, andthe comparison circuit, the control circuit to control the aging oftransistors in the degradable ring oscillator and to control thedetection of transistor aging.
 10. The integrated circuit of claim 9,wherein the control circuit to generate a data signal to couple into thereference ring oscillator and the aged ring oscillator to determine thedata delay in each, the control circuit to further control thecomparison circuit to control the comparison between the data delay inthe reference ring oscillator in determining transistor aging.
 11. Theintegrated circuit of claim 1, wherein the integrated circuit is amicroprocessor.
 12. A method in an integrated circuit comprising:applying a data signal to a first ring oscillator and a second ringoscillator; comparing a first delay in the data signal in the first ringoscillator with a second delay in the data signal in the second ringoscillator to detect transistor degradation; and adjusting a body biasto transistors in the integrated circuit to compensate for transistordegradation in response to the comparing detecting transistordegradation.
 13. The method of claim 12 further comprising: prior toapplying the data signal, enabling the first ring oscillator to agetransistors therein.
 14. The method of claim 12, wherein the first ringoscillator and the second ring oscillator have substantially similarcircuits.
 15. The method of claim 12, wherein the second ring oscillatorhas degraded transistors; and the first ring oscillator has transistorswithout degradation.
 16. The method of claim 15, wherein the comparingdetermines the second delay is greater than the first delay to detecttransistor degradation.
 17. The method of claim 12, wherein thecomparing determines the second delay is substantially equal to thefirst delay and detects no transistor degradation.
 18. A programmabledegradation monitor comprising: a reference ring oscillator to provide areference frequency signal and a reference delay signal in response to adata input signal; a degradable ring oscillator to provide an agedfrequency signal and an aged delay signal in response to the data inputsignal; and a comparison circuit coupled to the reference ringoscillator and the degradable ring oscillator, the comparison circuit tocompare the reference delay signal with the aged delay signal to detecttransistor aging within an integrated circuit.
 19. The programmabledegradation monitor of claim 18, further comprising: a controllercoupled to the reference ring oscillator, the degradable ringoscillator, and the comparison circuit, the controller to generate thedata input signal, to control the reference ring oscillator and thedegradable ring oscillator to generate the reference delay signal andthe aged delay signal, and to control the comparison circuit to comparethe reference delay signal with the aged delay signal to detecttransistor aging.
 20. The programmable degradation monitor of claim 18,wherein the reference ring oscillator and the degradable ring oscillatoreach include a programmable delay stage having a daisy chain of an oddnumber of inverters between a ring oscillator input and a ringoscillator output; and a multiplexer with a first data input to coupleto the data input signal, a second data input coupled to the ringoscillator output, an output coupled to the ring oscillator input, and aselect control to selectively couple the data input signal into theprogrammable delay stage to detect transistor aging.
 21. Theprogrammable degradation monitor of claim 18, wherein the comparisoncircuit includes a tri-state driver having a data input coupled to thereference ring oscillator and an enable input coupled to the degradablering oscillator, the tri-state driver to detect a timing differencebetween the reference delay signal and the aged delay signal to detecttransistor aging.
 22. The programmable degradation monitor of claim 21,wherein the tri-state driver is disabled by the aged delay signal priorto driving out a change in state in response to the reference delaysignal to detect no transistor aging.
 23. The programmable degradationmonitor of claim 21, wherein the tri-state driver changes a state in anoutput in response to the reference delay signal prior to being disabledby the aged delay signal prior to detect transistor aging.
 24. Theprogrammable degradation monitor of claim 18, wherein the comparisoncircuit further includes a latch coupled to the tri-state driver, thelatch to store a change in state in the output of the tri-state driverand to signal an aged condition to a body bias voltage generator tocompensate for the transistor aging.
 25. A system comprising: anintegrated circuit including a fast circuit including one or moretransistors with a body bias terminal to receive a body bias voltage anda source terminal to receive a power supply voltage, and a programmabledegradation monitor to detect degradation of transistors, theprogrammable degradation monitor including a reference ring oscillator,a degradable ring oscillator, and a comparison circuit, the comparisoncircuit to compare data delay in the reference ring oscillator and thedegradable ring oscillator to detect transistor degradation within theintegrated circuit; and a body bias voltage generator coupled to thefast circuit and the programmable degradation monitor of the integratedcircuit, the body bias voltage generator to adjust either the body biasvoltage or the power supply voltage coupled into the transistors of thefast circuit in response to transistor degradation detected by theprogrammable degradation monitor.
 26. The system of claim 25, whereinthe integrated circuit is a microprocessor including an execution unitto execute instructions.
 27. The system of claim 25, wherein thereference ring oscillator and the degradable ring oscillator eachinclude a selectively enabled programmable delay stage having an oddnumber of inverters daisy chained together between an input and anoutput, a ground enable to selectively enable and disable theselectively enabled programmable delay stage, and a selectively enabledcapacitive load to selectively program an initial delay between theinput and the output of the selectively enabled programmable delaystage, and a multiplexer coupled to the selectively enabled programmabledelay stage, the multiplexer in a ring oscillating mode to selectivelycouple the output of a last inverter in the odd number of inverters tothe input of a first inverter in the odd number of inverters and in atransistor degradation detection mode to selectively couple a data inputsignal into the programmable delay stage.
 28. The system of claim 25,wherein the integrated circuit and the body bias voltage generator arecoupled to a host printed circuit board.
 29. The system of claim 25,wherein the body bias voltage generator incrementally adjusts the bodybias voltage in response to the programmable degradation monitordetecting transistor degradation and for each incremental adjustment inthe comparison circuit, the programmable degradation monitor to evaluateif transistor degradation has been alleviated or if transistordegradation has been detected once again.